Special Issue on: Advances in the Theory and Application of Statistical Process Control Quality Technology & Quantitative Management

This special issue is devoted to celebrate the Quasquicentennial (125th) Birth Anniversary of the Father of Statistical Quality Control – Dr Walter Andrew Shewhart.

Papers  included in this special issue have significant importance to both practitioners and investigators for publication. These papers contain many new and recent results in Statistical Process Monitoring by researchers from different countries. Most papers also contain interesting ideas for further research.

We hope you will enjoy browsing this special issue and we thank you for all your support.

Special Issue Guest Editors:

Min Xie, Shenzhen Research Institute, City University of Hong Kong, Shenzhen, P.R. China
Amitava Mukherjee, XLRI-Xavier School of Management, India

*Articles published in this special issue are free to view until 30 April 2018 via this page only.